Share Email Print
cover

Proceedings Paper

Analysis and experimentation of adjustment math model for the ADS40 sensor
Author(s): Ye-wen Fan; Jian-ya Gong
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The ADS40 system is a multi-line-array digital photogrammetry system. It takes the photo of terrain by pushbroom scanning. Highly integrated with POS, it can obtain the orientation elements for every scan line through the post-process of POS. For the existence of system errors of GPS and IMU, the Orientation elements may not satisfy the highly precise application. It can be expressed with the function of time. In order to improve the accuracy of the orientation elements of each scan line, Aerial triangulation must be used. We set out from the principle of photogrammetry, analyze the imaging principle of ADS40, and put forward the imaging equations of ADS40 and the error equations of POS. We discuss on the relationship between the orientation elements of each scan line and time, and form the function of the orientation elements of each scan line and time. By introducing the conception of orientation fix we derive the adjustment math model which include the orientation elements obtained through the post-process of POS. Therefore we may illuminate the system errors or occasional errors of each observed value by adjustment, and achieve the aim to raise the accuracy of orientation elements.

Paper Details

Date Published: 29 December 2008
PDF: 7 pages
Proc. SPIE 7285, International Conference on Earth Observation Data Processing and Analysis (ICEODPA), 728510 (29 December 2008); doi: 10.1117/12.814901
Show Author Affiliations
Ye-wen Fan, Wuhan Univ. (China)
Jian-ya Gong, Wuhan Univ. (China)


Published in SPIE Proceedings Vol. 7285:
International Conference on Earth Observation Data Processing and Analysis (ICEODPA)
Deren Li; Jianya Gong; Huayi Wu, Editor(s)

© SPIE. Terms of Use
Back to Top