Share Email Print
cover

Proceedings Paper

Some answers to new challenges in optical metrology
Author(s): W. Osten
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The visible trend in the implementation of new technologies and creation of new products is the continuous reduction of feature sizes. However, in the same way as the feature sizes are decreasing, the theoretical and practical constraints of making them and ensuring their quality are increasing. Consequently, modern production and inspection technologies are confronted with a bundle of challenges. An important barrier for optical imaging and sensing is the diffraction limited lateral resolution. The observation of this physical limitation is of increasing importance, not only for microscopic techniques but also for the application of 3D-measurement techniques on wafer scale level. A further challenge is the reliable detection of imperfections and material faults within the production chain. This means in-line metrology/defectoscopy is a must for future production systems. Only the real-time feedback of the inspection results into the production process can contribute to a consistent quality assurance in processes with high cost risk. Moreover the reliable measurement of free form surfaces, both technical and optical, the assurance of the traceability and the certified assessment of the uncertainty of the measurement results are ongoing challenges. The challenges and the physical limitations are addressed here by new approaches for testing semiconductor structures with enhanced resolution, the measurement of aspheric lenses with increased flexibility and the inspection of micro components with improved traceability.

Paper Details

Date Published: 3 October 2008
PDF: 16 pages
Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 715503 (3 October 2008); doi: 10.1117/12.814687
Show Author Affiliations
W. Osten, Univ. Stuttgart (Germany)


Published in SPIE Proceedings Vol. 7155:
Ninth International Symposium on Laser Metrology
Chenggen Quan; Anand Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top