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Proceedings Paper

Influence of TFT-LCD pixel structure on holographic representation
Author(s): Hongjun Wang; Zhao Wang; Ailing Tian; Bingcai Liu
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Paper Abstract

As a new holographic display device, TFT-LCD (Thin Film Transistor Liquid Crystal Displays) is key technical component of holographic representation for easy controlled by computer. With the development of exquisite processing technology, that it instead of the traditional holographic plate become historical necessity and would be the development direction of holographic optics. Based on principles of holography and display character of LCD, the property which the LCD was used as a holographic plate was analyzed. The emphasis on discuss influence of LCD black matrix on holographic representation. First, analyzed on LCD pixel structure, the LCD pixel structure mathematical model was established. LCD was character representation by pixel structure parameters. Then, the influence of LCD pixels structure on holographic representation was analyzed by computer simulation. Meanwhile, the SONY LCX023 was chosen for holographic plate, the He-Ne laser which the wavelength is 0.6328um was holographic representation light source. The holographic representation system was established for test influence of LCD on holographic representation. Final, compared between computer simulations and optical experimental results, the mathematical model of LCD was proved to be true. When aperture ratio is 0.625, the holographic representation wouldn't be distinguished between representation images. At the same time, some useful results was acquired for improve application effects of LCD in holographic representation.

Paper Details

Date Published: 3 October 2008
PDF: 8 pages
Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 715532 (3 October 2008); doi: 10.1117/12.814612
Show Author Affiliations
Hongjun Wang, Xi'an Jiaotong Univ. (China)
Xi'an Technological Univ. (China)
Zhao Wang, Xi'an Jiaotong Univ. (China)
Ailing Tian, Xi'an Technological Univ. (China)
Bingcai Liu, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7155:
Ninth International Symposium on Laser Metrology
Chenggen Quan; Anand Asundi, Editor(s)

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