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Proceedings Paper

Study on measurement method for projectile location based on light screen
Author(s): Feng Han; QunHua Liu; GuoBin Sun
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Paper Abstract

In weapon-ammunition system, firing accuracy of projectile is major characteristic parameter weighing fire effect and capability of weapon-ammunition system for target. At present, firing accuracy of projectile is obtained by measuring the two-dimensional coordinates of projectile for target. In order to measure the parameters of two-dimensional coordinates of projectile for target, a new type of measurement system is proposed. The measurement system is composed of four high sensitivity light screens (known as target) with special geometrical frame. Light source of the screens is formed by special infrared LED array. The PIN infrared photodiodes array is used as the sensors. The longest effective distance between light source and sensors is 4m. It is impossible to achieve using traditional methods. Four light screens and high-precision timers are combined in order to acquire the value of time when the projectile flies across the position of four light screens. The real-time data acquirement and processing and display of two-dimensional coordinates and the projectile velocity can be realized. The principle of measurement system and the design of high sensitivity light screen are introduced emphatically. The measurement system was verified by using five kinds of small caliber pellets. As compared with the paper target sheet, the measurement system designed can meet the demand of check-up test of gun, bullet and ammunition. The firing testing in the target field has proved that the measurement system has the advantages of simple construction, easy operation and high precision and high sensitivity.

Paper Details

Date Published: 3 October 2008
PDF: 8 pages
Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 71552K (3 October 2008); doi: 10.1117/12.814594
Show Author Affiliations
Feng Han, Xi'an Technological Univ. (China)
QunHua Liu, Xi'an Technological Univ. (China)
GuoBin Sun, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7155:
Ninth International Symposium on Laser Metrology
Chenggen Quan; Anand Asundi, Editor(s)

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