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Proceedings Paper

Crack displacement sensing and measurement in concrete using circular grating moire fringes and pattern matching
Author(s): H. M. Chan; K. S. Yen; M. M. Ratnam
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Paper Abstract

The moire method has been extensively studied in the past and applied in various engineering applications. Several techniques are available for generating the moire fringes in these applications, which include moire interferometry, projection moire, shadow moire, moire deflectometry etc. Most of these methods use the superposition of linear gratings to generate the moire patterns. The use of non-linear gratings, such as circular, radial and elongated gratings has received less attention from the research community. The potential of non-linear gratings in engineering measurement has been realized in a limited number of applications, such as rotation measurement, measurement of linear displacement, measurement of expansion coefficients of materials and measurement of strain distribution. In this work, circular gratings of different pitch were applied to the sensing and measurement of crack displacement in concrete structures. Gratings of pitch 0.50 mm and 0.55 mm were generated using computer software and attached to two overlapping acrylic plates that were bonded to either side of the crack. The resulting moire patterns were captured using a standard digital camera and compared with a set of reference patterns generated using a precision positioning stage. Using several image pre-processing stages, such as filtering and morphological operations, and pattern matching the magnitude displacements along two orthogonal axes can be detected with a resolution of 0.05 mm.

Paper Details

Date Published: 3 October 2008
PDF: 8 pages
Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 715529 (3 October 2008); doi: 10.1117/12.814583
Show Author Affiliations
H. M. Chan, Univ. Sains Malaysia (Malaysia)
K. S. Yen, Univ. Sains Malaysia (Malaysia)
M. M. Ratnam, Univ. Sains Malaysia (Malaysia)

Published in SPIE Proceedings Vol. 7155:
Ninth International Symposium on Laser Metrology
Chenggen Quan; Anand Asundi, Editor(s)

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