Share Email Print

Proceedings Paper

Determination of third-order optical absorptive nonlinearity of ZnO nanoparticles by Z-scan technique
Author(s): R. Sreeja; R. Reshmi; George Manu; M. K. Jayaraj
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A sensitive single-beam technique for measuring the nonlinear absorption coefficient of ZnO nanoparticles is reported here. The transmittance T(z) of the sample is measured by open aperture Z-scan technique as the sample is moved along the propagation path(z) of a focused Gaussian laser beam. The ZnO nanoparticles synthesized by wet chemical method, by mixing zinc acetate dehydrate and NaOH in ethanol is a clear transparent colloidal solution. The average size of ZnO nanoparticles is 6nm as confirmed by TEM analysis. Two-photon absorption of colloidal solutions of ZnO nanoparticles in ethanol is investigated by the Z-scan method using the nanosecond pulses from the second harmonics of Nd:YAG laser (532nm). The value of β for ZnO dispersed in ethanol extracted from the Z-scan data are 2.1cm/GW. ZnO nanoparticles of various sizes were embedded in PVA matrix on glass substrate and size dependence on β value was analyzed. The high value of two photon absorption coefficient (β) demonstrate that ZnO nanoparticle is a potential material for optical limiting applications.

Paper Details

Date Published: 3 October 2008
PDF: 9 pages
Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 715521 (3 October 2008); doi: 10.1117/12.814575
Show Author Affiliations
R. Sreeja, Cochin Univ. of Science and Technology (India)
R. Reshmi, Cochin Univ. of Science and Technology (India)
George Manu, Cochin Univ. of Science and Technology (India)
M. K. Jayaraj, Cochin Univ. of Science and Technology (India)

Published in SPIE Proceedings Vol. 7155:
Ninth International Symposium on Laser Metrology
Chenggen Quan; Anand Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top