Share Email Print
cover

Proceedings Paper

A polarization sensitive interferometer for stress analysis
Author(s): Mahuya Sarkar; S. K. Sarkar; A. Basuray
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the present work a polarisation sensitive trangular path interferometer is developed to analyse the photoelastic stress pattern. To increase the sensitivity of the proposed interferometer a birefringent lens is used as a longitudinal interferometer to generate background fringes. The stress-induced birefringence of the sample will modify the fringe pattern, which gives a method for measurement of stress distribution of the sample. The method has all the advantages of a common path interferometer.

Paper Details

Date Published: 3 October 2008
PDF: 6 pages
Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 715519 (3 October 2008); doi: 10.1117/12.814545
Show Author Affiliations
Mahuya Sarkar, Univ. of Calcutta (India)
S. K. Sarkar, Univ. of Calcutta (India)
A. Basuray, Univ. of Calcutta (India)


Published in SPIE Proceedings Vol. 7155:
Ninth International Symposium on Laser Metrology
Chenggen Quan; Anand Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top