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Proceedings Paper

Quantitative radiography enabled by slot collimation and a novel scatter correction technique on a large-area flat panel x-ray detector
Author(s): Meghan L. Yue; Adam E. Boden; John M. Sabol
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Paper Abstract

In addition to causing loss of contrast and blurring in an image, scatter also makes quantitative measurements of xray attenuation impossible. Many devices, methods, and models have been developed to eliminate, estimate, and correct for the effects of scatter. Although these techniques can reduce the impact of scatter in a large-area image, no methods have proven to be practical and sufficient to enable quantitative analysis of image data in a routine clinical setting. This paper describes a method of scatter correction which uses moderate x-ray collimation in combination with a correction algorithm operating on data obtained from large-area flat panel detector images. The method involves acquiring slot collimated images of the object, and utilizing information from outside of the collimated region, in addition to a priori data, to estimate the scatter within the collimated region. This method requires no increase dose to the patient while providing high image quality and accurate estimates of the primary x-ray data. This scatter correction technique was validated through beam stop experiments and comparison of theoretically calculated and measured contrast of thin aluminum and polymethylmethacrelate objects. Measurements taken with various background material thicknesses, both with and without a grid, showed that the slot-scatter corrected contrast and the theoretical contrast were not significantly different given a 99% confidence interval. However, the uncorrected contrast was found to be significantly different from the corrected and theoretical contrasts. These findings indicate that this method of scatter correction can eliminate the effect of scatter on contrast and potentially enable quantitative x-ray imaging.

Paper Details

Date Published: 13 March 2009
PDF: 10 pages
Proc. SPIE 7258, Medical Imaging 2009: Physics of Medical Imaging, 725818 (13 March 2009); doi: 10.1117/12.813552
Show Author Affiliations
Meghan L. Yue, GE Healthcare (United States)
Adam E. Boden, GE Healthcare (United States)
John M. Sabol, GE Healthcare (United States)


Published in SPIE Proceedings Vol. 7258:
Medical Imaging 2009: Physics of Medical Imaging
Ehsan Samei; Jiang Hsieh, Editor(s)

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