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Proceedings Paper

The integration of multi-interactive patterns in virtual geographic environment
Author(s): Yi Yang; Guonian Lu; Yongning Wen; Hui Yang; Ying Hu
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Paper Abstract

Virtual Geographic Environment will be a modeling system supporting geographic analysis and visualization for geographic research on modern distributed, heterogeneous network environments. It allows users at different geographic locations sharing spatial information and interacting with each other via Internet. This paper proposes a new multi pattern interactive architecture for presenting different application patterns. The architecture for the integration of multi interactive patterns is separated into three main function layers: Data Layer, Virtual Geographic Environment Layer, and Application Layer. With the multi pattern interactive architecture, the Virtual Geographic Environment behaves itself with multiple application features, each of which is managed by a uniform object which is named "Entity". The objectoriented conceptual modeling mechanism is presented by "Entity" and the relationship between them. In order to fulfil the various interactive patterns of the Virtual Geographic Environment according to the users' requirements, multiple application aspects are integrated dynamically, such as Geo-spatial data sharing, Geographic model integration, twodimensional map, three-dimensional simulation and so on.

Paper Details

Date Published: 3 November 2008
PDF: 8 pages
Proc. SPIE 7143, Geoinformatics 2008 and Joint Conference on GIS and Built Environment: Geo-Simulation and Virtual GIS Environments, 714320 (3 November 2008); doi: 10.1117/12.812601
Show Author Affiliations
Yi Yang, Nanjing Normal Univ. (China)
Guonian Lu, Nanjing Normal Univ. (China)
Yongning Wen, Nanjing Normal Univ. (China)
Hui Yang, Nanjing Normal Univ. (China)
Ying Hu, Nanjing Normal Univ. (China)


Published in SPIE Proceedings Vol. 7143:
Geoinformatics 2008 and Joint Conference on GIS and Built Environment: Geo-Simulation and Virtual GIS Environments
Lin Liu; Xia Li; Kai Liu; Xinchang Zhang; Aijun Chen, Editor(s)

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