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Proceedings Paper

Data-driven measures of functional connectivity
Author(s): Tianhu Lei; John Dell; Raphy Magee; Timothy P. L. Roberts
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Paper Abstract

Studying interactions within the brain leads to an emerging field: functional connectivity. Functional connectivity between two brain units (neuron columns, recording sites, regions) can be defined as the temporal correlation between their time courses. Correlation between time courses of brain units are measured in different ways, e.g., Data-driven and/or Model-based approaches. This paper focuses on the former. The commonly used measures in Data-driven approach include, but are not limited to Coherence, Synchronization, Mutual Information, Nonlinear correlation coefficient, and Phase-Locking Values. We first describe the underlying reasons why these measures originated from distinctive fields of science and engineering can be applied to assess functional connectivity; then give the quantitative evaluation to each measure and indicate what are the limitations and conditions when they are applied, finally demonstrate the relations between these measures that may provide a basis for consistent assessments and interpretations on functional connectivity under investigation.

Paper Details

Date Published: 28 February 2009
PDF: 10 pages
Proc. SPIE 7262, Medical Imaging 2009: Biomedical Applications in Molecular, Structural, and Functional Imaging, 72621Z (28 February 2009); doi: 10.1117/12.812286
Show Author Affiliations
Tianhu Lei, Children's Hospital of Philadelphia (United States)
Univ. of Pennsylvania (United States)
John Dell, Children's Hospital of Philadelphia (United States)
Univ. of Pennsylvania (United States)
Raphy Magee, Children's Hospital of Philadelphia (United States)
Univ. of Pennsylvania (United States)
Timothy P. L. Roberts, Children's Hospital of Philadelphia (United States)
Univ. of Pennsylvania (United States)


Published in SPIE Proceedings Vol. 7262:
Medical Imaging 2009: Biomedical Applications in Molecular, Structural, and Functional Imaging
Xiaoping P. Hu; Anne V. Clough, Editor(s)

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