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Proceedings Paper

Two-photon fluorescence microscopy with differential aberration imaging
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Paper Abstract

We report our progress in the development of Differential Aberration Imaging (DAI), a technique that enhances twophoton fluorescence (TPEF) microscopy by improving rejection of out-of-focus background by means of a deformable mirror (DM). The DM is used to intentionally add aberrations to the imaging system, which causes dramatic losses to in-focus signal while preserving the bulk of the out-of-focus background. By taking the difference between TPEF images with and without added aberrations, the out-of-focus portion of the signal is further rejected. We now introduce an implementation of DAI using a new type of DM that can be produced at much lower cost.

Paper Details

Date Published: 24 February 2009
PDF: 5 pages
Proc. SPIE 7209, MEMS Adaptive Optics III, 720903 (24 February 2009); doi: 10.1117/12.812230
Show Author Affiliations
Kengyeh K. Chu, Boston Univ. (United States)
Aymeric Leray, Boston Univ. (United States)
Thomas G. Bifano, Boston Univ. (United States)
Jerome Mertz, Boston Univ. (United States)


Published in SPIE Proceedings Vol. 7209:
MEMS Adaptive Optics III
Scot S. Olivier; Thomas G. Bifano; Joel A. Kubby, Editor(s)

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