Share Email Print
cover

Proceedings Paper

Solid state photomultipliers and Geiger photodiodes with integrated readout and signal processing
Author(s): C. J. Stapels; E. B. Johnson; S. Mukhopadhyay; P. S. Linsay; E. C. Chapman; J. F. Christian
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

CMOS Geiger avalanche photodiodes (GPD), and parallel arrays of GPDs - a solid-state photomultiplier - are high-gain, high-sensitivity, versatile light sensors. Applications include readout of scintillation materials for nuclear detection and gamma ray imaging, scanning of biological fluorescence including flow cytometry, and as LIDAR sensors. Manufacturing such devices in CMOS provides the possibility of direct integration of signal processing and readout electronics monolithically with the sensor. Recently, RMD has fabricated SSPM arrays with pixel-level conditioning. For example, comparators at the pixel level are used, as described in this work, to condition the signal. These active pixel elements provide active quenching of the Geiger avalanche, increase dynamic range, and can suppress afterpulsing by the application of a long gate. A conditioned signal can also isolate the output from the temperature fluctuations that are often associated with silicon devices. We examine the performance of these integrated circuits at the pixel level and at the level of the whole sensor. Preliminary results show that sources of electronic noise are drastically reduced. The resulting isolation of the processed signals from bias and temperature fluctuations is presented.

Paper Details

Date Published: 17 February 2009
PDF: 5 pages
Proc. SPIE 7220, Silicon Photonics IV, 72200H (17 February 2009); doi: 10.1117/12.812104
Show Author Affiliations
C. J. Stapels, RMD, Inc. (United States)
E. B. Johnson, RMD, Inc. (United States)
S. Mukhopadhyay, RMD, Inc. (United States)
P. S. Linsay, RMD, Inc. (United States)
E. C. Chapman, RMD, Inc. (United States)
J. F. Christian, RMD, Inc. (United States)


Published in SPIE Proceedings Vol. 7220:
Silicon Photonics IV
Joel A. Kubby; Graham T. Reed, Editor(s)

© SPIE. Terms of Use
Back to Top