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Proceedings Paper

Optoelectronic technology application for measuring nonlinear optical properties by different geometry degenerate four wave mixing
Author(s): Wei-Bo Wang; De-Ying Chen; Rong-Wei Fan
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Paper Abstract

Nonlinear optical properties of optical materials are important factors. Degenerate four-wave mixing (DFWM), as a detective tool for yielding effectivex (3) values, is imposed the condition of phase matching on the incident and generated signal beams. Nowadays DFWM with forward geometry (FDFWM) has found increasing usage. However, phase-match is automatically achieved in the back phase-conjugated geometry but in the forward folded boxcars geometry. Also, the efficiency of DFWM reaches its maximum value when all three input beams are of the same intensity with regardless of the absorption coefficient and the detuning conditions. Further, weak signal beams under the strong background of stray light are hardly positioned and distinguished. To solve the problems, a new optoelectronic technique for detecting forward DFWM spectroscopy on iodine vapor has been performed. With the help of the detecting system, phase matching can be easily achieved in the optical arrangement. Finally Real-time detecting the rate of signal to noise so as to timely decrease the stray light with correct methods. This system makes it feasible that the potential application of FG-DFWM is used as a diagnostic tool in combustion research and environment monitoring.

Paper Details

Date Published: 2 February 2009
PDF: 5 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716035 (2 February 2009); doi: 10.1117/12.811997
Show Author Affiliations
Wei-Bo Wang, Harbin Normal Univ. (China)
Harbin Institute of Technology (China)
De-Ying Chen, Harbin Institute of Technology (China)
Rong-Wei Fan, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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