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Proceedings Paper

Seepage and settlement monitoring for earth embankment dams using fully distributed sensing along optical fibers
Author(s): P. Y. Zhu; Y. Zhou; Luc Thévenaz; G. L. Jiang
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Paper Abstract

A method for seepage and settlement monitoring in earth embankment dams using fully distributed sensing along optical fibres is proposed. A model is developed for simulating and monitoring seepage and settlement systems. This model relates the strains and the temperature changes to the fiber Brillouin gain spectrum in the embankment dam embedding the optical fiber sensors. The model consists of two parts. Submodel 1 addresses the simulation of seepage inside the embankment dam. Submodel 2 relates the measurement of the fiber Brillouin gain spectrum to the changes in temperature and strain inside the embankment dam. Both the changes in temperature and strain during the process are used to reveal serious seepages and settlements occurring inside the embankment dam. The continuously decreasing temperature curve shows an abrupt dramatic increasing rate, which shows that the change is not caused by the temperature of the seepage water but the strain. In this paper, as an example, a model filled with the soil from Yellow River is built and bare optical fibers are embedded under different soil layers near the seepage path. The simulated seepage flows under various flow rates are monitored using the optical fibers and measured by a DiTeSt -STA202 distributed temperature and strain analyzer. A partial settlement within the embankment dam model is observed.

Paper Details

Date Published: 3 February 2009
PDF: 7 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716013 (3 February 2009); doi: 10.1117/12.811964
Show Author Affiliations
P. Y. Zhu, Hunan Univ. of Science and Technology (China)
Y. Zhou, Ministry of Water Resources (China)
Luc Thévenaz, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
G. L. Jiang, Hunan Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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