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Proceedings Paper

Precision relative pose estimation at close range using single camera and laser range finder
Author(s): Hailiang Wang; Maosheng Xiang; Hongjian You; Lideng Wei; Yirong Wu
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Paper Abstract

As in close-range photogrammetry, space resection method is very frequently used in obtaining the exterior orientation data of a single photograph by applying the collinearity equation, but it has relatively poor accuracy in determining the line-of-sight component, especially in the condition the camera has a small field of view (FOV). This paper proposes a new solution for relative pose estimation of a setup consisting of a single camera, a Laser Range Finder (LRF), three optical targets and a array of cube-corner reflectors. These optical targets are installed properly on the target object as control points; the reflectors array is also fixed on the target object to make sure that sufficient signal energy could be returned to the Laser Range Finder. Rotations of the target object produce some errors in the measurements of LRF, so if we want to get the precise data of the line-of-sight component, the two-dimensional position in the array plane must be determined where the signal is returned from. In this paper we develop a method to solve the problem coupling with the pose data obtained from photogrammetry. We derive a new collinearity equation form and improve the one photograph space resection algorithm for the target object pose estimation relative to the camera or LRF. Simulation experiment results show that the algorithm can converge to a precision data during about 3 times least-squares iteration; the accuracy of position data achieve the level of sub-millimeter; and the RMS error of attitude data is less than 50 arcseconds.

Paper Details

Date Published: 2 February 2009
PDF: 8 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601A (2 February 2009); doi: 10.1117/12.811857
Show Author Affiliations
Hailiang Wang, Institute of Electronics (China)
Maosheng Xiang, Institute of Electronics (China)
Hongjian You, Institute of Electronics (China)
Lideng Wei, Institute of Electronics (China)
Yirong Wu, Institute of Electronics (China)

Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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