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Proceedings Paper

Three-dimensional whole circumference shape measurement system using optical patterns projection technique
Author(s): Katsumi Tsujioka; Yoshihisa Uchida; Jing-Nan Liu; Hideo Furuhashi; Yoshiyuki Uchida
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Paper Abstract

An automatic three-dimensional whole circumference shapes measurement system using an optical patterns projection technique has been developed. The system is composed of an optical spatial modulator from which grating patterns are projected on the surface of the object set on a turntable stage, a CCD camera controlled by a robot arm, and a computer. The patterns on the surface of the object are taken into the computer by the CCD camera, and the three-dimensional coordinates of the patterns on the surface of the object are calculated according to a principle of a trigonometry measurement. The patterns faced to the CCD camera are taken into the computer by the CCD camera, four photographs at each turntable angle of 0, 90, 180, and 270 degrees are processed and the image processing data are composed as whole circumference shapes. This improved system using mechanical and optical method and data analysis has the following advantages. (1) It is possible to capture the surface topography without any contact. (2) The time required for the measurements is shorter than the light-section method. (3) The optical spatial modulator using a liquid crystal projector enables to control the striped patterns accurately by the computer. (4) It is possible to measure precisely and to expand the measurement area using a zoom camera. (5) The improved system has whole circumference shapes measurement area as well as high resolution.

Paper Details

Date Published: 27 January 2009
PDF: 6 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71560C (27 January 2009); doi: 10.1117/12.811845
Show Author Affiliations
Katsumi Tsujioka, Fujita Health Univ. (Japan)
Yoshihisa Uchida, Aichi Institute of Technology (Japan)
Jing-Nan Liu, Southeast Univ. (China)
Hideo Furuhashi, Aichi Institute of Technology (Japan)
Yoshiyuki Uchida, Aichi Institute of Technology (Japan)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
Yunlong Sheng; Yongtian Wang; Lijiang Zeng, Editor(s)

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