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Proceedings Paper

Edge detection based on wavelet analysis
Author(s): Yan Ha; Xiaofei Wang
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Paper Abstract

Edge detection is one of the most basic contents in image processing and identification and plays an important role in the image processing. A new edge detection method based on the multi-scale of wavelet analysis and improving the image segmentation of the best threshold is proposed. The characteristics of this new edge detection operator have been analyzed in this paper. The advantages and disadvantages between the new operator and those traditional edge detection operators have also been discussed.

Paper Details

Date Published: 28 January 2009
PDF: 6 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562Z (28 January 2009); doi: 10.1117/12.811780
Show Author Affiliations
Yan Ha, Hebei Univ. (China)
Xiaofei Wang, Hebei Univ. (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
Yunlong Sheng; Yongtian Wang; Lijiang Zeng, Editor(s)

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