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Proceedings Paper

A parallel-friendly normalized mutual information gradient for free-form registration
Author(s): Marc Modat; Gerard R. Ridgway; Zeike A. Taylor; Daves J. Hawkes; Nick C. Fox; Sébastien Ourselin
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Paper Abstract

Non-rigid registration techniques are commonly used in medical image analysis. However these techniques are often time consuming. Graphics Processing Unit (GPU) execution appears to be a good way to decrease computation time significantly. However for an efficient implementation on GPU, an algorithm must be data parallel. In this paper we compare the analytical calculation of the gradient of Normalised Mutual Information with an approximation better suited to parallel implementation. Both gradient approaches have been implemented using a Free-Form Deformation framework based on cubic B-Splines and including a smoothness constraint. We applied this technique to recover realistic deformation fields generated from 65 3D-T1 images. The recovered fields using both gradients and the ground truth were compared. We demonstrated that the approximated gradient performed similarly to the analytical gradient but with a greatly reduced computation time when both approaches are implemented on the CPU. The implementation of the approximated gradient on the GPU leads to a computation time of 3 to 4 minutes when registering 190 × 200 × 124 voxel images with a grid including 57 × 61 × 61 control points.

Paper Details

Date Published: 27 March 2009
PDF: 8 pages
Proc. SPIE 7259, Medical Imaging 2009: Image Processing, 72590L (27 March 2009); doi: 10.1117/12.811588
Show Author Affiliations
Marc Modat, Univ. College London (United Kingdom)
Gerard R. Ridgway, Univ. College London (United Kingdom)
Zeike A. Taylor, Univ. College London (United Kingdom)
Daves J. Hawkes, Univ. College London (United Kingdom)
Nick C. Fox, Univ. College London (United Kingdom)
Sébastien Ourselin, Univ. College London (United Kingdom)


Published in SPIE Proceedings Vol. 7259:
Medical Imaging 2009: Image Processing
Josien P. W. Pluim; Benoit M. Dawant, Editor(s)

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