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Proceedings Paper

Weak-microcavity organic light-emitting diodes with improved light-extraction and wide viewing-angle
Author(s): Sang-Hwan Cho; Yong-Hee Lee; Young-Woo Song; Yoon-Chang Kim; Joon-Gu Lee; Jong Hyuk Lee; Kyu Hwan Hwang; Dong-Sik Zang
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Paper Abstract

We propose and demonstrate weak-microcavity organic light-emitting diode (OLED) displays that deliver both a high light-extraction efficiency and wide viewing-angle characteristics. A single pair of low- and high-index layers is inserted between indium tin oxide (ITO) and a glass substrate. The electroluminescent (EL) efficiencies of discrete red, green, and blue weak-microcavity OLEDs (WMOLEDs) are enhanced by 56%, 107%, and 26%, respectively with minimal changes viewing angle and EL spectra characteristics. The color purity is also improved for all three colors. Moreover, we fabricated full-color 128×160 passive-matrix bottom-emitting WMOLED displays to prove their manufacturability. This design is realized by simple one-step 20-nm etching of the low-index layer of red/green subpixels. The EL efficiency of white color in the WMOLED display is 27% higher than that of a conventional OLED display.

Paper Details

Date Published: 3 February 2009
PDF: 8 pages
Proc. SPIE 7231, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII, 72311H (3 February 2009); doi: 10.1117/12.810978
Show Author Affiliations
Sang-Hwan Cho, KAIST (Korea, Republic of)
Samsung SDI Co., Ltd. (Korea, Republic of)
Yong-Hee Lee, KAIST (Korea, Republic of)
Young-Woo Song, Samsung SDI Co., Ltd. (Korea, Republic of)
Yoon-Chang Kim, Samsung SDI Co., Ltd. (Korea, Republic of)
Joon-Gu Lee, Samsung SDI Co., Ltd. (Korea, Republic of)
Jong Hyuk Lee, Samsung SDI Co., Ltd. (Korea, Republic of)
Kyu Hwan Hwang, Samsung SDI Co., Ltd. (Korea, Republic of)
Dong-Sik Zang, Samsung SDI Co., Ltd. (Korea, Republic of)


Published in SPIE Proceedings Vol. 7231:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII
Klaus P. Streubel; Heonsu Jeon; Li-Wei Tu, Editor(s)

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