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Proceedings Paper

Fast differential luminescence thermometry
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Paper Abstract

Differential luminescence thermometry (DLT) allows non-contact method of measuring temperature by timedifferencing luminescence spectra emitted from the material in study. Here, we present a modification to the DLT technique, termed "two-pixel DLT" (2pixDLT), that combines high temperature and temporal resolutions at the expense of reduced spectral sampling of the luminescence signal. We showcase our technique by demonstrating millisecond/millidegree resolution in time and temperature in heating dynamics of GaAs heterostructure sample. We utilize tnis technique to determine minimum achievable temperature in rare-earth doped fluoride crystal Yb:YLF to be 170K, when excited at 1030nm.

Paper Details

Date Published: 9 February 2009
PDF: 5 pages
Proc. SPIE 7228, Laser Refrigeration of Solids II, 72280K (9 February 2009); doi: 10.1117/12.810856
Show Author Affiliations
Denis V. Seletskiy, The Univ. of New Mexico (United States)
Michael P. Hasselbeck, The Univ. of New Mexico (United States)
Mansoor Sheik-Bahae, The Univ. of New Mexico (United States)
Richard I. Epstein, The Univ. of New Mexico (United States)
Los Alamos National Lab. (United States)

Published in SPIE Proceedings Vol. 7228:
Laser Refrigeration of Solids II
Richard I. Epstein; Mansoor Sheik-Bahae, Editor(s)

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