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Proceedings Paper

Loss mechanism in InGaN laser diodes grown on low-dislocation-density bulk GaN
Author(s): Chong Cook Kim; Yoon-Ho Choi; Min-Soo Noh
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Proc. SPIE 7216, Gallium Nitride Materials and Devices IV, ; doi: 10.1117/12.810794
Show Author Affiliations
Chong Cook Kim, LG Electronics Inc. (Korea, Republic of)
Yoon-Ho Choi, LG Electronics Inc. (Korea, Republic of)
Min-Soo Noh, LG Electronics Inc. (Korea, Republic of)


Published in SPIE Proceedings Vol. 7216:
Gallium Nitride Materials and Devices IV
Hadis Morkoç; Cole W. Litton; Jen-Inn Chyi; Yasushi Nanishi; Joachim Piprek; Euijoon Yoon, Editor(s)

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