Share Email Print
cover

Proceedings Paper

Measurement of minimum resolvable contrast based on human visual property
Author(s): Yuan Zhang; Jingmin Dai; Wenjuan Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order to evaluate the imaging quality of a visible imaging system by measuring the minimum resolvable contrast (MRC), a novel MRC measurement method is proposed to judge the test patterns at different spatial frequencies and contrasts so that the right pattern can be identified using a computer instead of human eyes. A MRC measurement system with two integrating spheres is therefore developed. The two integrating spheres can be used to illuminate either side of the target and the contrasts of patterns on the target can be changed by controlling the special attenuators near the entrances of the two integrating spheres. During the judgment human visual properties to the luminance and frequency are considered, the computer can therefore simulate human eyes better. Experimental results indicate that the errors of measuring the luminance can be controlled within ..0.3cd/m2, which offers a guaranteed precision for the measurement of MRC. The MRC values at all the frequencies are less than those by observers. The measurement of MRC is not influenced by human subjective factors. This method can be used to measure the MRC of a visible imaging system more accurately and helps to realize the automatic measurement of MRC.

Paper Details

Date Published: 12 January 2009
PDF: 7 pages
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333V (12 January 2009); doi: 10.1117/12.810628
Show Author Affiliations
Yuan Zhang, Harbin Univ. of Science and Technology (China)
Jingmin Dai, Harbin Institute of Technology (China)
Wenjuan Li, Harbin Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7133:
Fifth International Symposium on Instrumentation Science and Technology
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top