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Proceedings Paper

Pavement roughness measurement based on structure light
Author(s): WanYu Liu; Xiaoming Sun; Jian Ping Huang; Kai Xie
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Paper Abstract

Pavement roughness is an important index to reflect the quality of pavement. To improve the efficiency of pavement roughness measurement, a novel pavement roughness measurement system based on structured light vision inspection is proposed in this paper. By describing the principle of structured light inspection and measurement system design, it is stressed that the proposed system can be used to acquire a continuous longitudinal profile of pavement and International Roughness Index by using the structured light illumination and CCD. Some experiments are performed to test orientation precision and performance of the system. The experimental results show that the system has some pros such as high orientation precision, good stability and low cost.

Paper Details

Date Published: 12 January 2009
PDF: 6 pages
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71332X (12 January 2009); doi: 10.1117/12.810576
Show Author Affiliations
WanYu Liu, Harbin Institute of Technology (China)
Xiaoming Sun, Harbin Institute of Technology (China)
Jian Ping Huang, Harbin Institute of Technology (China)
Kai Xie, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 7133:
Fifth International Symposium on Instrumentation Science and Technology
Jiubin Tan; Xianfang Wen, Editor(s)

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