Share Email Print
cover

Proceedings Paper

Comprehensive laser beam characterization for applications in material processing
Author(s): Klaus Mann; Armin Bayer; Maik Lübbecke; Bernd Schäfer
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

With ever more stringent requirements regarding the quality of laser-supported production processes, measuring techniques for comprehensive characterization of laser beams and beam delivery optics are rapidly gaining importance. Of particular interest is precise knowledge regarding the beam profile, the beam propagation characteristics, and the wavefront. The latter describes the local direction of energy flux and carries detailed information about the beam aberrations, including intrinsic ones as well as those introduced by optical elements along the beam path. In this paper we give an overview of the status and current developments in the field of laser beam characterization. Examples from industrial applications are given, including the diagnostics of 193 nm excimer lasers. Along with a description of measuring procedures according to ISO standards, emphasis is placed on diagnostics based on Hartmann-Shack wavefront sensors. From the wavefront and the simultaneously recorded near-field profile beam parameters such as diameter, divergence, and M2 can be evaluated in real-time. In addition, the approach also accomplishes prediction of the propagation behavior of the radiation field.

Paper Details

Date Published: 24 February 2009
PDF: 11 pages
Proc. SPIE 7202, Laser-based Micro- and Nanopackaging and Assembly III, 72020C (24 February 2009); doi: 10.1117/12.810515
Show Author Affiliations
Klaus Mann, Laser-Lab. Göttingen e.V. (Germany)
Armin Bayer, Laser-Lab. Göttingen e.V. (Germany)
Maik Lübbecke, Laser-Lab. Göttingen e.V. (Germany)
Bernd Schäfer, Laser-Lab. Göttingen e.V. (Germany)


Published in SPIE Proceedings Vol. 7202:
Laser-based Micro- and Nanopackaging and Assembly III
Wilhelm Pfleging; Yongfeng Lu; Kunihiko Washio; Willem Hoving; Jun Amako, Editor(s)

© SPIE. Terms of Use
Back to Top