Share Email Print
cover

Proceedings Paper

High-speed random equivalent sampling system for time-domain reflectometry
Author(s): Jian-hui Song; Feng Yuan; Zhen-liang Ding
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Time domain reflectometry (TDR) has been commonly used for testing cable for years. The waveform attenuation and distortion of TDR pulse is an inherent problem for the correct definition of arrival time and propagation velocity of traveling wave. For the purpose of obtaining the required information of incident and reflected pulse waveform, a highspeed random equivalent sampling (RES) system with 65ps sampling resolution is proposed for a high-resolution TDR. The problem of data storage and communication caused by high sampling rate is solved by using both digital signal processors (DSP) and field programmable gate arrays (FPGA). The detail architecture of the implemented circuit and software is described, including the control logic and data processing algorithm. The real-time sampling rate of the system is up to 125MHz, with 15.4GHz equivalent sampling bandwidth. The test results show that the proposed system can be used as a high-speed data acquisition and processing unit.

Paper Details

Date Published: 12 January 2009
PDF: 6 pages
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71330W (12 January 2009); doi: 10.1117/12.810488
Show Author Affiliations
Jian-hui Song, Harbin Institute of Technology (China)
Feng Yuan, Harbin Institute of Technology (China)
Zhen-liang Ding, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 7133:
Fifth International Symposium on Instrumentation Science and Technology
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top