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Proceedings Paper

Probing photoelectronic emission from nanostructures based on conductive atomic force microscopy and femtosecond laser illumination
Author(s): Nipun Misra; David J. Hwang; Costas P. Grigoropoulos; Emmanuel Stratakis; Emmanuel Spanakis; Costas Fotakis; Panagiotis Tzanetakis
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Paper Details

Date Published:
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Proc. SPIE 7201, Laser Applications in Microelectronic and Optoelectronic Manufacturing VII, 720113; doi: 10.1117/12.809983
Show Author Affiliations
Nipun Misra, Univ. of California, Berkeley (United States)
David J. Hwang, Univ. of California, Berkeley (United States)
Costas P. Grigoropoulos, Univ. of California, Berkeley (United States)
Emmanuel Stratakis, Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (Greece)
Univ. of Crete (Greece)
Technological Educational Institute of Crete (Greece)
Emmanuel Spanakis, Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (Greece)
Univ. of Crete (Greece)
Technological Educational Institute of Crete (Greece)
Costas Fotakis, Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (Greece)
Panagiotis Tzanetakis, Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (Greece)


Published in SPIE Proceedings Vol. 7201:
Laser Applications in Microelectronic and Optoelectronic Manufacturing VII
Michel Meunier; Andrew S. Holmes; Hiroyuki Niino; Bo Gu, Editor(s)

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