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Proceedings Paper

Cell palpation system for local mechanical properties of a cell with an optically manipulated particle
Author(s): H. Miyoshi; T. Sugiura; K. Minato
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Paper Abstract

During cell adhesion and migration, a cell forms focal adhesion, which connects cytoskeleton with extracellular matrix (ECM) through integrin, and applies cytoskeletal force to the ECM through focal adhesion. In the initial phase of cell adhesion (initial adhesion), protein related to cell adhesion recruits other components to reinforce adhesion force and grows to focal complex. To study the mechanism of cell adhesion, we focused on relationship between variation of mechanical property of cell adhesion and related protein for cell adhesion. Especially, we approached by understanding mechanical property of initial adhesion. To measure this property, we developed a "cell palpation system", which utilizes optical tweezers to apply mechanical stimulus to a cell and to investigate reactive force. As below, this system gives information on the mechanical property (membrane support tension) and a time course of the property by using an optically manipulated microbead through an analysis based on mechanical model of this microbead. To create cell adhesion between the microbead and cell surface, the microbead was coated with collagen and we investigated the mechanical property of initial adhesion. And we analyzed the processes in relation to maturation of initial adhesion at a single molecular level.

Paper Details

Date Published: 12 February 2009
PDF: 10 pages
Proc. SPIE 7182, Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues VII, 718211 (12 February 2009); doi: 10.1117/12.809794
Show Author Affiliations
H. Miyoshi, Nara Institute of Science and Technology (Japan)
T. Sugiura, Nara Institute of Science and Technology (Japan)
K. Minato, Nara Institute of Science and Technology (Japan)


Published in SPIE Proceedings Vol. 7182:
Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues VII
Daniel L. Farkas; Dan V. Nicolau; Robert C. Leif, Editor(s)

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