Share Email Print
cover

Proceedings Paper

Optical characterization of the heat-affected zone in laser patterning of thin film a-Si:H
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper we present an original approach to estimate the heat affected zone in laser scribing processes for photovoltaic applications. We used high resolution IR-VIS Fourier transform spectrometry at micro-scale level for measuring the refractive index variations at different distances from the scribed line, and discussing then the results obtained for a-Si:H layers irradiated in different conditions that reproduce standard interconnection parameters. In order to properly assess the induced damage by the laser process, these results are compared with measurements of the crystalline state of the material using micro-Raman techniques. Additionally, the authors give details about how this technique could be used to feedback the laser process parametrization in monolithic interconnection of thin film photovoltaic devices based on a-Si:H.

Paper Details

Date Published: 24 February 2009
PDF: 10 pages
Proc. SPIE 7202, Laser-based Micro- and Nanopackaging and Assembly III, 72020R (24 February 2009); doi: 10.1117/12.809514
Show Author Affiliations
Carlos L. Molpeceres, Univ. Politécnica de Madrid (Spain)
Monica Colina, Univ. Politécnica de Madrid (Spain)
Miguel Holgado, Univ. Politécnica de Madrid (Spain)
Miguel Morales, Univ. Politécnica de Madrid (Spain)
Isabel Sanchez-Aniorte, Univ. Politécnica de Madrid (Spain)
Sara Lauzurica, Univ. Politécnica de Madrid (Spain)
Juan J. Garcia-Ballesteros, Univ. Politécnica de Madrid (Spain)
José L. Ocaña, Univ. Politécnica de Madrid (Spain)


Published in SPIE Proceedings Vol. 7202:
Laser-based Micro- and Nanopackaging and Assembly III
Wilhelm Pfleging; Yongfeng Lu; Kunihiko Washio; Willem Hoving; Jun Amako, Editor(s)

© SPIE. Terms of Use
Back to Top