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Proceedings Paper

Reliability of diode lasers for space applications
Author(s): K. Häusler; U. Zeimer; B. Sumpf; F. Bugge; P. Ressel; G. Erbert; G. Tränkle
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Paper Abstract

Qualification results of diode lasers for space applications are presented. Quantum well lasers (AlGaAs / GaAsP at 808 nm) were subjected to accelerated life test. No sudden failure was observed for 120 emitters at different stress conditions over 10,000 hours. Gradual degradation after more than 20,000 hours was modeled by recombination enhanced defect generation and statistically analyzed by the non-linear mixed effects model. The gradually degraded devices were investigated with cathodoluminescence. Statistical inference indicates the reliable operation of diode lasers throughout the typical life time of space equipment.

Paper Details

Date Published: 23 February 2009
PDF: 12 pages
Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 719816 (23 February 2009); doi: 10.1117/12.809111
Show Author Affiliations
K. Häusler, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
U. Zeimer, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
B. Sumpf, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
F. Bugge, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
P. Ressel, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
G. Erbert, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
G. Tränkle, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)


Published in SPIE Proceedings Vol. 7198:
High-Power Diode Laser Technology and Applications VII
Mark S. Zediker, Editor(s)

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