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Proceedings Paper

Mechanical stress in rare-earth-doped laser fibers
Author(s): Florian Just; Hans Rainer Müller; Stephan Grimm; Hartmut Bartelt
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Paper Abstract

Mechanical stress can significantly influence the optical and mechanical properties of fibers. We present results of nondestructive measurements of thermal stress in rare-earth-doped optical fibers, which are related to the doping variations across the fiber cross section and the preparation conditions. The samples are preforms and fibers with a large ytterbium doped core that were prepared by an alternative glass forming process, which is capable to realize bigger ratios of core to cladding diameter than the MCVD-method. To the best of our knowledge, this is the first time measurements of stresses and birefringence were made on such active optical fibers and their preforms. The results are compared to previous results on ytterbium-doped samples fabricated by the MCVD-technology. From the resultant stress profile, we could calculate the stress induced index changes that are relevant for the light propagation in optical fibers, and discuss the reasons for the observed mechanical stress. In addition, we could evaluate the samples regarding their changes in thermal expansion coefficient induced by doping with one or more oxides in several concentrations and different ratios. We confirmed our earlier result that the active doping component ytterbium generates much higher stress than other common dopants like aluminum, phosphorus or boron.

Paper Details

Date Published: 6 February 2009
PDF: 8 pages
Proc. SPIE 7212, Optical Components and Materials VI, 72120M (6 February 2009); doi: 10.1117/12.808989
Show Author Affiliations
Florian Just, Institute of Photonic Technology Jena (Germany)
Hans Rainer Müller, Institute of Photonic Technology Jena (Germany)
Stephan Grimm, Institute of Photonic Technology Jena (Germany)
Hartmut Bartelt, Institute of Photonic Technology Jena (Germany)


Published in SPIE Proceedings Vol. 7212:
Optical Components and Materials VI
Shibin Jiang; Michel J. F. Digonnet; John W. Glesener; J. Christopher Dries, Editor(s)

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