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Proceedings Paper

Thickness and index measurements of a transparent specimen by full-field optical coherence microscopy
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Paper Abstract

We present the method measuring the thickness and the refractive index of a transparent specimen at a same time based on full-field optical coherence tomography. As a sample a small drop of epoxy was placed on a flat plate and the high-resolution depth resolved en-face images of the epoxy drop were taken. With adopting the plate surface as a reference plane, the physical thickness and the refractive index distribution could be obtained. Owing to the full-field imaging capability, we could obtain the transverse distributions of the thickness and the refractive index without any transverse scanning. The measured thickness at the center of the sample was 24 μm and the average index was 1.4055 with the standard deviation of 0.0002.

Paper Details

Date Published: 3 March 2009
PDF: 7 pages
Proc. SPIE 7184, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVI, 71841B (3 March 2009); doi: 10.1117/12.808971
Show Author Affiliations
Jihoon Na, Gwangju Institute of Science and Technology (Korea, Republic of)
Woo June Choi, Gwangju Institute of Science and Technology (Korea, Republic of)
Hae Young Choi, Gwangju Institute of Science and Technology (Korea, Republic of)
Seon Young Ryu, Gwangju Institute of Science and Technology (Korea, Republic of)
Eun Seo Choi, Chosun Univ. (Korea, Republic of)
Byeong Ha Lee, Gwangju Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 7184:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVI
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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