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Proceedings Paper

Refractive-index sensor incorporating a polymeric waveguide overlaid with TiO2 thin films
Author(s): Geun-Sik Son; Soon-Woo Kwon; Woo-Kyung Kim; Woo-Seok Yang; Hyung-Man Lee; Han-Young Lee; Sung-Dong Lee; Sang-Shin Lee
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Paper Abstract

A refractive index sensor based on a three-layered polymeric waveguide was proposed and demonstrated. A high-index thin film in TiO2 was placed on top of the waveguide in the sensing region, playing the role of strengthening the evanescent field to enhance the sensitivity of the sensor. The refractive index of the analyte applied to the surface of the sensor was estimated by observing the count of the polarimetric interference between the TE and TM polarizations, which is manifested as a periodic variation in the optical output of the sensor. For a fabricated sensor involving a 20 nm thick TiO2 film, the sensitivity was found to be equivalent to 1.8x10-3 RIU. It was found to be enhanced by increasing the thickness of the high-index overlay to a certain degree.

Paper Details

Date Published: 10 February 2009
PDF: 10 pages
Proc. SPIE 7218, Integrated Optics: Devices, Materials, and Technologies XIII, 721818 (10 February 2009); doi: 10.1117/12.808860
Show Author Affiliations
Geun-Sik Son, Kwangwoon Univ. (Korea, Republic of)
Soon-Woo Kwon, Sungkyunkwan Univ. (Korea, Republic of)
Woo-Kyung Kim, Korea Electronics Technology Institute (Korea, Republic of)
Woo-Seok Yang, Korea Electronics Technology Institute (Korea, Republic of)
Hyung-Man Lee, Korea Electronics Technology Institute (Korea, Republic of)
Han-Young Lee, Korea Electronics Technology Institute (Korea, Republic of)
Sung-Dong Lee, Infopia Co., Ltd. (Korea, Republic of)
Sang-Shin Lee, Kwangwoon Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 7218:
Integrated Optics: Devices, Materials, and Technologies XIII
Jean-Emmanuel Broquin; Christoph M. Greiner, Editor(s)

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