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Proceedings Paper

Oscillation frequency stabilization of a semiconductor laser by an indirect modulation method using the Faraday effect
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Paper Abstract

Scientists throughout the world are seeking to enhance the capabilities of satellite-to-satellite tracking laser interferometer-based optical systems used to measure the alterations in earth's gravitational field that indicate critical changes in the environment. These systems must be able to measure infinitesimal fluctuations in the relative velocities of two satellites, using a light source that oscillates at a level of frequency stability rated better than 10-13 in the square root of the Allan variance. In our experiments, semiconductor laser frequency stabilization that typically requires a brief direct modulation of the laser injection current to obtain an error signal, was accomplished using the Faraday effect of Rb absorption lines. This effectively modulates the reference frequency of the stabilization system, i.e., the Rb absorption line, by modulating the magnetic field applied to the Rb absorption cell, instead of the oscillation frequency of the laser diode. Most recently, we used the Faraday method, in conjunction with a precision temperature controller. For present purposes, we also use the PEAK method, to obtain the most accurate signal possible, comparing it with saturated absorption spectroscopic readings, to determine the noise-source.

Paper Details

Date Published: 24 February 2009
PDF: 9 pages
Proc. SPIE 7211, Physics and Simulation of Optoelectronic Devices XVII, 72110A (24 February 2009); doi: 10.1117/12.808803
Show Author Affiliations
Akira Sato, Niigata Univ. (Japan)
Shinya Maehara, Niigata Univ. (Japan)
Tomoyuki Uehara, Kyoto Univ. (Japan)
Hideaki Arai, Niigata Univ. (Japan)
Takashi Sato, Niigata Univ. (Japan)
Tadashi Tamura, Niigata Univ. (Japan)
Masashi Ohkawa, Niigata Univ. (Japan)
Seiji Kawamura, National Astronomical Observatory (Japan)

Published in SPIE Proceedings Vol. 7211:
Physics and Simulation of Optoelectronic Devices XVII
Marek Osinski; Bernd Witzigmann; Fritz Henneberger; Yasuhiko Arakawa, Editor(s)

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