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Proceedings Paper

Ultra-high sensitivity photodetector arrays with integrated amplification and passivation nano-layers
Author(s): Jie Yao; Sean Wang; Jack Zhou; Ken Li; Michael Lange; Weiguo Yang; Patrick Gardner; Leora Peltz; Robert Frampton; Jeffrey H. Hunt; Jill Becker
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Paper Abstract

Miniaturized field-deployable spectrometers used for rapid analysis of chemical and biological substances require high-sensitivity photo detectors. For example, in a Raman spectroscopy system, the receiver must be capable of high-gain, low-noise detection performance due to the intrinsically weak signals produced by the Raman effects of most substances. We are developing a novel, high-gain hetero-junction phototransistor (HPT) detector which employs two nano-structures simultaneously: a 3-30 nm passivation layer that enables micron-sized devices, large-scale integration and low-cost products; and a 50-65 nm amplification layer that offers high sensitivity with 1,000x amplification and zero avalanche access noise. We report preliminary tests on single pixels, validating the design target of >1,000 Ampere/Watt responsivity at the near infrared wavelength of 1550nm, which is 100 times more sensitive than InGaAs avalanche photodiodes, the most sensitive commercially available photo-detector in this wavelength range, under their normal operation conditions. Integrated into a detector array, this technology has application for Laser-Induced Breakdown Spectroscopy (LIBS), pollution monitoring, pharmaceutical manufacturing by reaction monitoring, chemical & biological transportation safety, and bio-chemical analysis in planetary exploration.

Paper Details

Date Published: 6 February 2009
PDF: 5 pages
Proc. SPIE 7212, Optical Components and Materials VI, 72120Y (6 February 2009); doi: 10.1117/12.808442
Show Author Affiliations
Jie Yao, B&W Tek, Inc. (United States)
Sean Wang, B&W Tek, Inc. (United States)
Jack Zhou, B&W Tek, Inc. (United States)
Ken Li, B&W Tek, Inc. (United States)
Michael Lange, Dolce Technologies (United States)
Weiguo Yang, Western Carolina Univ. (United States)
Patrick Gardner, Western Carolina Univ. (United States)
Leora Peltz, The Boeing Co. (United States)
Robert Frampton, The Boeing Co. (United States)
Jeffrey H. Hunt, The Boeing Co. (United States)
Jill Becker, Cambridge NanoTech Inc. (United States)

Published in SPIE Proceedings Vol. 7212:
Optical Components and Materials VI
Shibin Jiang; Michel J. F. Digonnet; John W. Glesener; J. Christopher Dries, Editor(s)

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