Share Email Print
cover

Proceedings Paper

Near-field birefringence response of IPS liquid crystal thin film detected by Bi-SNOM
Author(s): Jing Qin; Norihiro Umeda
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Dynamics information of nematic liquid crystal (NLC) in In-Plane-Switching (IPS) mode is attractive and important for applications of high vision angle techniques. In this paper, we used a novel evaluation method to detect the molecular orientation dynamics of NLC thin film in depth direction from its birefringence responses using birefringence scanning near-field optical microscopy (Bi-SNOM). In this method, a Bi-SNOM probe is inserted into IPS mode NLC thin film, in which the time responses of LC molecules at different position in depth are also measured. In addition, Molecular orientation hysteresis to the applied voltage is observed. We measured the orientation hysteresis of LC molecules at different position along the depth direction in the LC thin film. Experimental results show that the proposed method is effective and feasible for its consistence with original specialities.

Paper Details

Date Published: 12 January 2009
PDF: 9 pages
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333D (12 January 2009); doi: 10.1117/12.807778
Show Author Affiliations
Jing Qin, Tokyo Univ. of Agriculture and Technology (Japan)
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 7133:
Fifth International Symposium on Instrumentation Science and Technology

© SPIE. Terms of Use
Back to Top