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Proceedings Paper

DLP-based 3D metrology by structured light or projected fringe technology for life sciences and industrial metrology
Author(s): G. Frankowski; R. Hainich
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Paper Abstract

Since the mid-eighties, a fundamental idea for achieving measuring accuracy in projected fringe technology was to consider the projected fringe pattern as an interferogram and evaluate it on the basis of advanced algorithms widely used for phase measuring in real-time interferometry. A fundamental requirement for obtaining a sufficiently high degree of measuring accuracy with this so-called "phase measuring projected fringe technology" is that the projected fringes, analogous to interference fringes, must have a cos2-shaped intensity distribution. Until the mid-nineties, this requirement for the projected fringe pattern measurement technology presented a basic handicap for its wide application in 3D metrology. This situation changed abruptly, when in the nineties Texas Instruments introduced to the market advanced digital light projection on the basis of micro mirror based projection systems, socalled DLP technology, which also facilitated the generation and projection of cos2-shaped intensity and/or fringe patterns. With this DLP technology, which from its original approach was actually oriented towards completely different applications such as multimedia projection, Texas Instruments boosted phase-measuring fringe projection in optical 3D metrology to a worldwide breakthrough both for medical as well as industrial applications. A subject matter of the lecture will be to present the fundamental principles and the resulting advantages of optical 3D metrology based on phase-measuring fringe projection using DLP technology. Further will be presented and discussed applications of the measurement technology in medical engineering and industrial metrology.

Paper Details

Date Published: 14 February 2009
PDF: 12 pages
Proc. SPIE 7210, Emerging Digital Micromirror Device Based Systems and Applications, 72100C (14 February 2009); doi: 10.1117/12.807709
Show Author Affiliations
G. Frankowski, GFMesstechnik GmbH (Germany)
R. Hainich, GFMesstechnik GmbH (Germany)

Published in SPIE Proceedings Vol. 7210:
Emerging Digital Micromirror Device Based Systems and Applications
Larry J. Hornbeck; Michael R. Douglass, Editor(s)

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