Share Email Print
cover

Proceedings Paper

Approach method based on brightness temperature for multi-spectral thermometer
Author(s): Guibin Yuan; Zhigang Fan; Xiaogang Sun; Jingmin Dai
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

It is known from relationship between brightness temperature and true temperature of a multi-spectral thermometer that brightness temperature is equal to true temperature if the wavelength approaches to zero. Thus true temperature can be acquired by fitting brightness temperatures and corresponding wavelengths using non-linear least squares method. This method was named AMBT (approach method based on brightness temperature). The emissivities of metals and nonmetals were used to simulate AMBT at a temperature from 160K to 3000K. The effective wavelengths chosen are 3.00, 3.25, 3.50, 3.75, 4.00, 4.25, 4.50 and 4.75 micron in the atmospheric window of 3-5 micron. While in another atmospheric window of 8-12 micron, the effective wavelengths are 8.00, 8.50, 9.00, 9.50, 10.00, 10.50, 11.00 and 11.50 micron. Actual measurements were used to verify the effectiveness of AMBT. Results show that the errors are always smaller at a lower temperature and increase with the increase in temperature. The errors of 3-5 micron are lower than those of 8-12 micron. At same temperature, the errors of metals are lower than those of non-metals. AMBT is more accurate to be used at a low temperature than be used at a high temperature. AMBT can be used to identify materials in common use, offering a new method to get true temperature of low temperature objects.ï

Paper Details

Date Published: 12 January 2009
PDF: 10 pages
Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 713309 (12 January 2009); doi: 10.1117/12.807691
Show Author Affiliations
Guibin Yuan, Harbin Institute of Technology (China)
Zhigang Fan, Harbin Institute of Technology (China)
Xiaogang Sun, Harbin Institute of Technology (China)
Jingmin Dai, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 7133:
Fifth International Symposium on Instrumentation Science and Technology

© SPIE. Terms of Use
Back to Top