Share Email Print
cover

Proceedings Paper

Broadband polarization compensation in silicon-on-insulator components using cladding stress engineering
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We review the applications of cladding stress induced birefringence for controlling the polarization dependent properties in SOI waveguide components. In particular, we discuss the phase index and group index birefringence and their dispersion in this high index contrast waveguide platform, and the influence of waveguide cross-section geometry and cladding stress on these properties. Design of broadband polarization independent ring resonators using stress engineering is presented.

Paper Details

Date Published: 12 August 2008
PDF: 7 pages
Proc. SPIE 7099, Photonics North 2008, 70991O (12 August 2008); doi: 10.1117/12.807478
Show Author Affiliations
Dan-Xia Xu, National Research Council Canada (Canada)
André Delâge, National Research Council Canada (Canada)
Siegfried Janz, National Research Council Canada (Canada)
Pavel Cheben, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 7099:
Photonics North 2008

© SPIE. Terms of Use
Back to Top