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Proceedings Paper

Subpixel location method of Bessel light center based on improved spin filtering and gray scale interpolation
Author(s): Wenping Yang; Hao Meng; Jihua Fu; Zhongyu Wang
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Paper Abstract

The Bessel light triangulation system has the advantages of long measurement range, high accuracy and resolution over the traditional laser triangulation system. Unfortunately the measurement accuracy is degraded due to various noises in practical application. In order to improve the measurement accuracy, a novel effective location method for the center spot of the Bessel light is presented in this paper through the improved spin filtering and gray scale bilinear interpolation. In this method, the stripe orientation is accurately estimated by using surface fitting for gray scale, determine the gray scale contoured window based on a map of the stripe orientation, and apply grey relational analysis so as to remove the interference noises. Then the center spot region, roughly obtained by adaptive threshold method, is implemented bilinear interpolation for gray scale to specify the accurate location of the center spot, which is extracted with the centroid method for gray scale. Through the sample and simulation analysis, the proposed method is insensitive to the imperfection of the Bessel light intensity distribution and has better performance of anti-noise. In addition, the result of locating the center spot is more reliable with the accuracy of sub-pixels.

Paper Details

Date Published: 13 October 2008
PDF: 7 pages
Proc. SPIE 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration, 71290Y (13 October 2008); doi: 10.1117/12.807375
Show Author Affiliations
Wenping Yang, BeiHang Univ. (China)
Hao Meng, BeiHang Univ. (China)
Jihua Fu, BeiHang Univ. (China)
Zhongyu Wang, BeiHang Univ. (China)


Published in SPIE Proceedings Vol. 7129:
Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration

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