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Proceedings Paper

Polarization sensitivity analysis of reflective optical systems
Author(s): Ying Zhang; Huijie Zhao; Haibo Zhao
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Paper Abstract

Reflective optical systems are used widely in space optics and polarization sensitivity is one of the important factors to describe the polarization properties of the light passing through optical systems. In this paper, a unified discussion of the polarization sensitivity theory is presented and the method of using polarization ray tracing is used to analyze the polarization sensitivity caused by the reflectors in reflective optical systems. The Mueller calculus used in polarization ray tracing is studied to calculate the linear polarization sensitivity LPS in reflective optical systems. The changed rules of the polarization sensitivity are also studied. A Ritchey-Chretien system is presented as an example system to be analyzed. According to the results of the polarization analysis, it is proved that the change of the polarization sensitivity is serious in the reflective optical systems those have high numerical aperture, large incident angles or work in wide wavelength.

Paper Details

Date Published: 13 October 2008
PDF: 6 pages
Proc. SPIE 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration, 71290R (13 October 2008); doi: 10.1117/12.807361
Show Author Affiliations
Ying Zhang, Beijing Univ. of Aeronautics and Astronautics (China)
Huijie Zhao, Beijing Univ. of Aeronautics and Astronautics (China)
Haibo Zhao, Beijing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 7129:
Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration

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