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Proceedings Paper

Object recognition based on relationship between camera vibration and measurement error on stereo measurement
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Paper Abstract

This study aims to establish an error model of the stereo measurement system considering camera vibration. At first, we verified the distribution of disparity error under the circumstance without the camera vibration and with the camera vibration. As the result, we found that we can approximate the distribution of disparity error by normal distribution under the circumstance without camera vibration and with camera vibration. And, the parameters of normal distribution are changed by the camera vibration. The parameters of the distribution of the measurement error are average μ and standard deviation σ. The parameters of the camera vibration are considered amplitude A and frequency F. In order to verify relationships during the parameters of the distribution of measurement error and the parameters of the camera vibration, we experimented using the vibration testing system. We imposed simple harmonic motion to the stereo camera. In this paper, we use stereo camera Bumblebee. As the result of experiment, the camera vibration didn't affect average μ. We found positively correlation between standard deviation σ and amplitude A. And, we found negatively correlation between standard deviation σ and frequency F. We estimate the parameters of measurement error by the parameter of the camera vibration using these relationships. So, we establish the error model of the stereo measurement system. Moreover, we define existing probability of object using the parameter of measurement error.

Paper Details

Date Published: 17 November 2008
PDF: 8 pages
Proc. SPIE 7266, Optomechatronic Technologies 2008, 726619 (17 November 2008); doi: 10.1117/12.807265
Show Author Affiliations
Shin'ya Okazaki, Hokkaido Univ. (Japan)
Takayuki Tanaka, Hokkaido Univ. (Japan)
Shun'ichi Kaneko, Hokkaido Univ. (Japan)
Hidenori Takauji, Hokkaido Univ. (Japan)

Published in SPIE Proceedings Vol. 7266:
Optomechatronic Technologies 2008
John T. Wen; Dalibor Hodko; Yukitoshi Otani; Jonathan Kofman; Okyay Kaynak, Editor(s)

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