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Proceedings Paper

Pulse and amplifier dynamics in high energy fiber optic ultrashort pulse laser systems
Author(s): Michael Mielke; David Gaudiosi; Kyungbum Kim; Tolga Yilmaz; Michael Greenberg; Sha Tong; Xinhua Gu; Mark Geusen; Robert Cline; Mark Slovick; Neill Allen; Michael Manning; Barry Schuler; Steven Sapers
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Paper Abstract

Ultrashort pulse lasers based on fiber optic architecture will play a dominant role in the spread of these lasers into research and industrial applications. The principle challenge is to generate adequate pulse energy from singlemode or quasi-singlemode amplifiers which have small cross-sectional area. We demonstrate a robust, all-fiber erbium amplifier system that produces >100 μJ per pulse with 701 fs pulsewidth and M2 < 1.3. We will discuss the salient amplifier dynamics that influence the pulse generation, shaping, and propagation phenomena in state-of-the-art erbium fiber lasers. Furthermore, we show data relevant to applications and implementation of ultrashort pulse lasers.

Paper Details

Date Published: 7 February 2009
PDF: 14 pages
Proc. SPIE 7214, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIII, 72140V (7 February 2009); doi: 10.1117/12.807217
Show Author Affiliations
Michael Mielke, Raydiance, Inc. (United States)
David Gaudiosi, Raydiance, Inc. (United States)
Kyungbum Kim, Raydiance, Inc. (United States)
Tolga Yilmaz, Raydiance, Inc. (United States)
Michael Greenberg, Raydiance, Inc. (United States)
Sha Tong, Raydiance, Inc. (United States)
Xinhua Gu, Raydiance, Inc. (United States)
Mark Geusen, Raydiance, Inc. (United States)
Robert Cline, Raydiance, Inc. (United States)
Mark Slovick, Raydiance, Inc. (United States)
Neill Allen, Raydiance, Inc. (United States)
Michael Manning, Raydiance, Inc. (United States)
Barry Schuler, Raydiance, Inc. (United States)
Steven Sapers, Raydiance, Inc. (United States)

Published in SPIE Proceedings Vol. 7214:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIII
Kong-Thon Tsen; Jin-Joo Song; Markus Betz; Abdulhakem Y. Elezzabi, Editor(s)

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