Share Email Print
cover

Proceedings Paper

Resolution improvement of the electronic theodolite in automatic guided laser theodolite system by subdivided locating method of image
Author(s): Hu Zhou; Jigui Zhu; Zili Zhang; Shenghua Ye
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Electronic theodolites are widely used for spatial coordinate measurement in assembly manufacturing industry, but the traditional operation of theodolites is time-consuming, which can not meet the application of online measurement. So in the automatic guided laser theodolite system including two electronic motored theodolites, a method for improving resolution of the electronic theodolite based on subdivided locating of laser spot image was expounded to eliminate the errors. On the basis of a brief introduction of the automatic guided laser theodolite system, factors related to the measuring errors were analyzed, with the conclusion that angle resolution of theodolite had an effect impact on the phenomenon of no coincidence between the laser spot and the target point. Then the image including the message of the laser spot adopted by the external camera was processed to subdivide in pixel level. Sequently comparison of the measuring results was made between the original measuring data and the data corrected by the subdivided locating method in the same theodolite measuring model to evaluate the feasibility of the operation and to find the most suitable interpolation method. The experimental data of the system verified the high precision and efficiency of the method.

Paper Details

Date Published: 3 February 2009
PDF: 9 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602O (3 February 2009); doi: 10.1117/12.807057
Show Author Affiliations
Hu Zhou, Tianjin Univ. (China)
Jigui Zhu, Tianjin Univ. (China)
Zili Zhang, Tianjin Univ. (China)
Shenghua Ye, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

© SPIE. Terms of Use
Back to Top