Share Email Print
cover

Proceedings Paper

The effective image denoising method for MEMS based IR image arrays
Author(s): Liquan Dong; Xiaohua Liu; Yuejin Zhao; Ming Liu; Mei Hui; Xiaoxiao Zhou
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

MEMS have become viable systems to utilize for uncooled infrared imaging in recent years. They offer advantages due to their simplicity, low cost and scalability to high-resolution FPAs without prohibitive increase in cost. An uncooled thermal detector array with low NETD is designed and fabricated using MEMS bimaterial microcantilever structures that bend in response to thermal change. The IR images of objects obtained by these FPAs are readout by an optical method. For the IR images, processed by a sparse representation-based image denoising and inpainting algorithm, which generalizing the K-Means clustering process, for adapting dictionaries in order to achieve sparse signal representations. The processed image quality is improved obviously. Great compute and analysis have been realized by using the discussed algorithm to the simulated data and in applications on real data. The experimental results demonstrate, better RMSE and highest Peak Signal-to-Noise Ratio (PSNR) compared with traditional methods can be obtained. At last we discuss the factors that determine the ultimate performance of the FPA. And we indicated that one of the unique advantages of the present approach is the scalability to larger imaging arrays.

Paper Details

Date Published: 3 February 2009
PDF: 9 pages
Proc. SPIE 7159, 2008 International Conference on Optical Instruments and Technology: MEMS/NEMS Technology and Applications, 71590L (3 February 2009); doi: 10.1117/12.807056
Show Author Affiliations
Liquan Dong, Beijing Institute of Technology (China)
Xiaohua Liu, Beijing Institute of Technology (China)
Yuejin Zhao, Beijing Institute of Technology (China)
Ming Liu, Beijing Institute of Technology (China)
Mei Hui, Beijing Institute of Technology (China)
Xiaoxiao Zhou, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 7159:
2008 International Conference on Optical Instruments and Technology: MEMS/NEMS Technology and Applications

© SPIE. Terms of Use
Back to Top