Share Email Print
cover

Proceedings Paper

A novel image denoising method based on force field transform
Author(s): Yan Zhang; Kun Gao; Guoqiang Ni; Tingzhu Bai
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As a fundamental image processing operation, a good denoising method should keep the original image information as much as possible. However, most denoising methods may degrade or remove the fine details and texture of the original image. In this paper, a force field method is adopted to transform the image pixels within a local window into a potential energy surface and then to distinguish the image edges and the noises in this potential energy field. Afterwards, different templates are used according to the judgment and the adaptive filter is applied to the local pixels respectively. This new method has less computational complexity than the other algorithms of transform domain, which means it can be implemented in a real-time processing system. Also the new method can preserve more image edges than the traditional filters. Finally the performance of the proposed method is compared in this paper with other popular methods by using evaluation criterion of SNR and SSIM(a measure of structural similarity). The results show that the proposed method is reliable and especially helpful to preserve the image details.

Paper Details

Date Published: 28 January 2009
PDF: 8 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562D (28 January 2009); doi: 10.1117/12.807031
Show Author Affiliations
Yan Zhang, Beijing Institute of Technology (China)
Kun Gao, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)
Tingzhu Bai, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments

© SPIE. Terms of Use
Back to Top