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Proceedings Paper

Vibration analysis based on electronic stroboscopic speckle-shearing pattern interferometry
Author(s): Dagong Jia; Changsong Yu; Tianhua Xu; Chao Jin; Hongxia Zhang; Wencai Jing; Yimo Zhang
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Paper Abstract

In this paper, an electronic speckle-shearing pattern interferometer with pulsed laser and pulse frequency controller is fabricated. The principle of measuring the vibration in the object using electronic stroboscopic speckle--shearing pattern interferometer is analyzed. Using a metal plate, the edge of which is clamped, as an experimental specimen, the shear interferogram are obtained under two experimental frequencies, 100 Hz and 200 Hz. At the same time, the vibration of this metal plate under the same experimental conditions is measured using the time-average method in order to test the performance of this electronic stroboscopic speckle-shearing pattern interferometer. The result indicated that the fringe of shear interferogram become dense with the experimental frequency increasing. Compared the fringe pattern obtained by the stroboscopic method with the fringe obtained by the time-average method, the shearing interferogram of stroboscopic method is clearer than the time-average method. In addition, both the time-average method and stroboscopic method are suited for qualitative analysis for the vibration of the object. More over, the stroboscopic method is well adapted to quantitative vibration analysis.

Paper Details

Date Published: 3 February 2009
PDF: 10 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716014 (3 February 2009); doi: 10.1117/12.806992
Show Author Affiliations
Dagong Jia, Tianjin Univ. (China)
Changsong Yu, Tianjin Univ. (China)
Tianhua Xu, Tianjin Univ. (China)
Chao Jin, Tianjin Univ. (China)
Hongxia Zhang, Tianjin Univ. (China)
Wencai Jing, Tianjin Univ. (China)
Yimo Zhang, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

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