Share Email Print
cover

Proceedings Paper

Modeling and analysis of dialyte-lens auto-focusing technology for theodolite
Author(s): Lin-tao Wu; Yan-feng Qiao; Deng-Ke Wu; Sheng Cai
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order to realize real-time auto-focusing for theodolite, lens-apart method was designed with the corresponding math model built and analyzed. An Object beam splitted after the first image surface of the theodolite traveled through two dialyte lens and then was imaged on CCD. The distance between two spots when exactly focused was set as the calibration value, and the relationship between defocus distance and spot offset was given. The influence of tracking center shift and divergence angle etc. on focusing accuracy was analyzed. Compared with the traditional focusing method, this scheme has a higher accuracy, faster calculation, higher tolerance for environment temperature and a simpler construction. The experiment result exhibited a resolution higher than 0.056mm, which shows a bright engineering application prospect for this method.

Paper Details

Date Published: 3 February 2009
PDF: 6 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602E (3 February 2009); doi: 10.1117/12.806990
Show Author Affiliations
Lin-tao Wu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yan-feng Qiao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Deng-Ke Wu, Graduate School of the Chinese Academy of Sciences (China)
Xi’an Institute of Optics and Precision Mechanics (China)
Sheng Cai, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Science (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

© SPIE. Terms of Use
Back to Top