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Proceedings Paper

Trace H2S monitoring based on off-axis integrated cavity output spectroscopy
Author(s): Dahai Yu; Xia Li; Haitao Gu; Xiumin Gao; Wei Huang; Yu Zhang; Haibo Ma; Zhiwei Ma; Pingbo Gao; Wenmin Zhen; Ying Li; Yu Qi; Luhong Wen; Jian Wang
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Paper Abstract

The trace H2S in range of 0-20ppm has been measured by means of off-axis integrated cavity output spectroscopy (OA-ICOS) technology combined with tunable diode laser absorption spectroscopy (TDLAS) technology. The instrument uses off-axis alignment geometry to eliminate the problem of mode matching between laser and optical resonant cavity, in absenting the piezoelectric transducer. Combined with the high sensitivity of the TDLAS technology, sensitivity of the instrument is improved. The repeatability of instrument in H2S measurement achieves to 0.303ppm (3σ), linearity less than ±1% F.S., which meet the requirement of trace H2S measurement in petrochemical or natural gas industry.

Paper Details

Date Published: 28 January 2009
PDF: 6 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715627 (28 January 2009); doi: 10.1117/12.806966
Show Author Affiliations
Dahai Yu, Hangzhou Dianzi Univ. (China)
Focused Photonics Inc. (China)
Xia Li, Focused Photonics Inc. (China)
Haitao Gu, Hangzhou Dianzi Univ. (China)
Dublin City Univ. (Ireland)
Xiumin Gao, Hangzhou Dianzi Univ. (China)
Wei Huang, Focused Photonics Inc. (China)
Yu Zhang, Focused Photonics Inc. (China)
Haibo Ma, Focused Photonics Inc. (China)
Zhiwei Ma, Focused Photonics Inc. (China)
Pingbo Gao, Focused Photonics Inc. (China)
Wenmin Zhen, Focused Photonics Inc. (China)
Ying Li, Focused Photonics Inc. (China)
Yu Qi, Focused Photonics Inc. (China)
Luhong Wen, Focused Photonics Inc. (China)
Jian Wang, Hangzhou Dianzi Univ. (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments

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