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Proceedings Paper

Application of multi-sensors parallel fusion system in photoelectric tracing
Author(s): Guo-ying Cheng; Sheng Cai; Hui-bin Gao; Shu-mei Zhang; Yan-Feng Qiao
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Paper Abstract

To solve the real-time and reliability problem of tracking servo-control system in optoelectronic theodolite, a multisensors parallel processing system was proposed. Misdistances of three different wavebands were imported into system, and then prediction was done in DSP1 to get the actual position information. Data fusion was accomplished in PPGA imported by multi channel buffer serial port. The compound position information was used to control the theodolite. The results were compared with external guide data in DSP2 to implement correction of above calculation, and then were imported to epistemic machine through PXI interface. The simulation experiment of each calculation unit showed that this system could solve the real-time problem of feature level data fusion. The simulation result showed that the system can satisfy the real-time requirement with 1.25ms in theodolite with three imaging systems, while sampling frequency of photoelectric encoder was 800 Hz.

Paper Details

Date Published: 3 February 2009
PDF: 7 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716024 (3 February 2009); doi: 10.1117/12.806946
Show Author Affiliations
Guo-ying Cheng, Changchun Institute of Optics, Fine Mechanics and Physics, (China)
Graduate School of the Chinese Academy of Sciences (China)
Sheng Cai, Changchun Institute of Optics, Fine Mechanics and Physics, (China)
Graduate School of the Chinese Academy of Sciences (China)
Hui-bin Gao, Changchun Institute of Optics, Fine Mechanics and Physics, (China)
Shu-mei Zhang, Changchun Institute of Optics, Fine Mechanics and Physics, (China)
Yan-Feng Qiao, Changchun Institute of Optics, Fine Mechanics and Physics, (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications

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