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Proceedings Paper

Density detection system of woven fabric with complex patterns
Author(s): Zhong-he Huang; Xiang-ning Li; Lei Zhong
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Paper Abstract

Warp and weft density is commonly considered as one of the most important index for estimating the quality of fabrics. However, the detecting method adopted is basically base on manually counting. It is rather inefficient. This article demonstrates how to construct efficient system to achieve automatically detection. Fabric is first coupled into the image sensor by a specific optical system, whose resolution matching is carefully designed. And other component parameters are also well considered. What is more, the system contains a light source to provide uniformed illumination. A circuit board with camera module is constructed to perform the role of image processing platform. With amazingly agile performance provide by an ARM920T processor, and featuring an incredible breadth of peripheral interfaces, the platform is well suit for fabric density detection. The periodicity within the captured image furnishes convenience for analysis in frequency domain. After FFT the intensity peaks ranked orderly around the original point. However, the peaks in the spectrum are always blurred by severe interference whose form is usually an image or a pattern on the fabric. For this reason, a specific algorithm should be worked out to erode the peaks from the blurred edge to the center. Sometimes, the central peak is so severely blurred and the central peak is actually useless for us, a unique algorithm is employed to kick off the central peak. By this way, the position of the surround peaks can be easily located. And the density can also be easily worked out.

Paper Details

Date Published: 28 January 2009
PDF: 11 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715622 (28 January 2009); doi: 10.1117/12.806920
Show Author Affiliations
Zhong-he Huang, Univ. of Shanghai for Science and Technology (China)
Xiang-ning Li, Univ. of Shanghai for Science and Technology (China)
Lei Zhong, Univ. of Shanghai for Science and Technology (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments

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